Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEE Transactions on Information Theory
سال: 2019
ISSN: 0018-9448,1557-9654
DOI: 10.1109/tit.2019.2903244